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| Reasons of IGBT failure and the determination method in fly-back charging circuit of CINRAD/SA radar |
| LIANG Zhao-yang1, SU Yi2, WU Guo-rui1 |
1.Zhaoqing Meteorological Administration, GuangdongZhaoqing 526060;
2.Quanzhou Meteorological Administration, FujianQuanzhou 362000 |
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Abstract CINRAD/SA radar system has been established for many years, with operation, management and maintenance, and made a great contribution to the meteorological of China. However,based on the historical radar technical support statistics shows that transmitter failure is in a higher proportion of the entire radar system,while the Insulated Gate Bipolar Transistor (IGBT) failure is the most serious factor of the transmitter failure. It’s so inconvenience to maintenance and fault location for the IGBT in high current, high power state in the fly-back charging circuit. This paper described The principle of IGBT and the working process of fly-back charging circuit, analyzed the IGBT failure phenomenon in the actual operation and gave the investigation points for trouble-shooting, in order to shorten the time to locate faults and solutions to improve the efficiency of radar maintenance.
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2013, Vol. 30 
